年度	2008
全部作者	杨千,Chyan Yang, Chao-Jung Chang, Han-Jen Niu, and Hsueh-Chang Wu
论文名称	Increasing Detectability in Semiconductor Foundry by Multivariate Statistical Process Control
期刊名称	Total Quality Management & Business Excellence
卷数	19
期数	5
页码	429-440